An X-ray diffractometer that equipped with a two-dimensional detector is used for developing the technique of grain size measurement for strong textured and coarse-grained Si steel sheet. The method is based on the concept that the position of diffraction spots depends on the orientation of individual grains. The two-dimensional detector has the ability to collect abundant diffraction information in seconds, thus it can be determined rapidly and accurately whether a series of diffraction spots come from the same grain. The experimental results show that this method can be used for measuring grain size and its distribution in strong textured and coarse-grained metal sheets.
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