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采用放电等离子烧结(SPS)方法制备Ag掺杂四元Ag-Bi-Se-Te合金,并分析研究其热电性能.结果表明:掺杂Ag后,合金AgxBi(2-x)Se0.3Te2.7(x=0.005~0.04)的Seebeck系数均为负值,说明材料属于n-型半导体;当温度大约在428.0K时,x=0.04合金的Seebeck系数绝对值(|a|)出现最大值,其值为1.80×10-4V·K-1,比三元合金Bi2Se0.3Te2.7的最大值增大约16%;材料电导率随Ag含量的增加而下降.如果采用相同方法制备且成分按(Bi2Te3)0.9-(Bi2-xAgxSe3)0.1(x=0~0.4)设计的材料热扩散系数进行估算,当温度在477.0 K时,合金AgxBi(2-x)Se0.3Te2.7(x=0.04)的ZT值出现最大值,其值为0.75,比典型三元合金Bi2Se0.3Te2.7的最大值增大约0.09.

参考文献

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