采用溶胶-凝胶法在氧化铟锡(ITO)导电玻璃基底上制备了不同掺杂浓度的Li∶ZnO薄膜,并且利用场发射扫描电子显微镜(FE-SEM)、X射线衍射仪(XRD)、紫外-可见-近红外分光光度计(UV-VIS-NIR)、荧光光谱仪(PL)多种测试手段研究了不同掺锂浓度对ZnO薄膜的结构形貌、晶格常数、禁带宽度以及光致发光的影响.结果显示,Li的掺入导致ZnO薄膜的晶格常数减小,同时禁带宽度也减小.光致发光谱表明,掺Li后的ZnO薄膜的可见光发光峰由绿光发光峰和黄光发光峰组成,并且发生红移.我们认为,黄光发射可能是电子由单电离氧空位VO+到缔合缺陷LiZnVO的跃迁引起的,并且提出了缔合缺陷LiZnVO的结构模型.
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