本文采用键参数函数方法,总结二元复合氧化物稳定性的规律。研究表明:离子键型复合氧化物的生成热,主要与离子半径和价数有关。具有部分共价性的复合氧化物的生成热和热力学稳定性,除上述因素外,还与失屏参数有关。
Factors concerning with the stability of binary complex oxides has been stu-died. For complex oxides with ionic bonds,the main factors determining the heatof formation of such oxides appear to be the relevant ionic radius and the va-lency of the component elements. For oxides with partial covalency, however, thescreening parameter proposed in this paper may also be important in addition tothe factors mentioned above.
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