在铌酸锂(LN)晶体衬底上磁控溅射铟锡氧化物(ITO)薄膜,研究了射频磁控溅射制备ITO/LN薄膜的最佳工艺.采用原子力显微镜(AFM)和X射线衍射(XRD)分析了透明导电ITO膜的制备工艺参数对薄膜表面形貌和晶体结构的影响,同时应用四探针电阻率测量和紫外可见光谱测量技术对所研制的ITO/LN膜的光电性质进行了研究.结果表明,衬底温度为320℃,溅射时间50 min时制备的ITO/LN薄膜具有最佳光电性质,在该条件制备出薄膜的电阻率为3.41×10-4Ω·cm,ITO/LN平均可见光透光率可达74.38%,平均透光率比LN衬底提高了1.1%.应用该溅射条件制备了泰伯效应位相阵列器,其近场衍射成像的相对光强可达0.67.
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