本文提出一种与线形变化无关的测定衍射线线位的新方法。测位精度可达△θ±0.01°。可用于在衍射线形对称增宽的条件下,精确测定点阵常数。
A new method for the determination of the diffraction line position was developed without relation to the diffraction profile. The precision in determination may approach to △θ±0.01°. It seems to be applicable to the precise determination of the lattice constants under the condition of broadening diffraction profile symmetrically.
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