A Novel Deflection Method for Measuring the Growth Stress of Thermally Growing Oxide Scales

材料科学技术（英文）, 2003, 19(3): 231-234.

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1.Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences,Shenyang 110016, China

2.Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences,Shenyang 110016, China

基金项目: the Special Funds for the Major State Basic Research Projects(G19990650)

A Novel Deflection Method for Measuring the Growth Stress of Thermally Growing Oxide Scales

Keywords： Oxide film

A kind of new deflection technique has been developed for measuring the growth stress of thermally growing oxide scales duringhigh temperature oxidation of alloys. The average growth stresses in oxide scales such as Al2O3, NiO and Cr2O3 formed onthe surface of the superalloys can be investigated by this technique. Unlike the comventional deflection method, the novelmethod does not need to apply a coating for preventing one main face of thin strip specimen from oxidizing and can be usedunaer tne condition of longer time and higher temperature.

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材料期刊网

A Novel Deflection Method for Measuring the Growth Stress of Thermally Growing Oxide Scales

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