采用Cu-In预制层后硫化法制备CuInS2(CIS)薄膜.研究了硫源处载气流量对薄膜形貌、成分及结构等的影响.用扫描电镜(SEM)、能量色散谱仪(EDS)、X射线衍射仪(XRD)对薄膜形貌、成分、结构进行了表征,并用扩散生长模型加以解释.结果表明,具有CuIn和CuIn2混合相的Cu-In预制膜,在不同的载气流量下,硫化后所制备的薄膜均具有CIS/CuxIny/Cu结构.检测结果支持铜、铟离子穿过先期生成的CIS膜向外扩散,在表面处与硫反应生成CIS的生长模型.
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