为探讨电子束物理气相沉积(EB-PVD)制备8 mol.％氧化钇稳定氧化锆(8YSZ)涂层过程中工艺参数对涂层致密性、表面粗糙度和晶粒择优取向生长的影响,利用扫描电镜、原子力显微镜和X射线衍射技术对涂层的上述性能进行了分析.分析结果表明,随沉积速率由750 nm/min下降至20 nm/min,YSZ涂层的晶粒逐渐聚合长大,晶粒之间的孔隙减少,涂层的气体扩散系数相应地由2.41×10-4cm4/(N·s)下降至6.56×10-5 cm4/(N·s).YSZ涂层的表面粗糙度随靶基距的提高逐渐降低,涂层的晶体学取向随蒸汽粒子入射角的改变而改变,入射角为30°时(111)晶面具有平行于涂层表面排列的趋势,入射角为45°时(311)和(420)晶面具有平行于表面排列的趋势,而入射角为60°时(220)和(331)晶面具有平行于表面排列的趋势.
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