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将BiGaO3和BiInO3分别引入BiScO3-PbTiO3(BSPT)体系,并通过氧化物合成法制备了0.075BiGaO3-(0.925-x)BiScO3-xPbTiO3(SPTx, x=0.58~0.62)和0.075BiInO3-(0.925-x)BiScO3-xPbTiO3(BISPTx, x=0.61~0.65)压电陶瓷.X射线衍射分析表明,BiGaO3和BiInO3的替换掺杂均不影响BSPT体系的钙钛矿结构.随着PbTiO3含量的增加,SPTx和BISPTx陶瓷由三方钙钛矿结构逐渐变到四方结构,其三方-四方准同型相界分别位于x=0.60和x=0.62附近.在准同型相界附近,SPTx陶瓷的压电常数d33,机电耦合系数kp为分别为350pC/N和52.0%,而BISPTx的d33高达475pC/N,kp为52.3%.介电常数的温度特性测试表明,掺入Ga3+可以有效地提升BSPT体系的居里温度,其MPB组分(x=0.60)居里温度高达472℃,而掺入In3+对BSPT体系的居里温度影响则不明显.

参考文献

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