采用第一性原理的密度泛函理论(DFT)研究了(5,5)碳纳米管(CNT)顶端硼(B)、氮(N)、硅(Si)等元素双掺杂体系的电子场发射性能.结果表明,在外电场下,各种双掺杂CNT帽端态密度(DOS)向价带移动.电子轨道分布变化显著,电荷分布明显局城化.根据电子态密度、差分电荷密度、最高分子占据轨道(HOMO)/最低分子非占据轨道(LUMO)分布等计算结果可预期Si双掺杂后更有利于场致电子发射.
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