分别采用两种高分子辅助化学溶液沉积方法,在双轴织构的NiW(200)合金基底上制备了涂层导体CeO2缓冲层.结果表明,制得的CeO2缓冲层双轴织构良好,表面无裂纹.比较两种不同的高分子辅助方法,利用聚甲基丙烯酸辅助制得的CeO2表面平整,均方根粗糙度在1 μm×1μm的范围内仅为2 nm,粗糙度远小于利用聚乙烯醇辅助沉积而得的CeO2缓冲层.
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