采用脉冲激光沉积(PLD)法在钠钙玻璃衬底上制备了CuGaSe2∶Ge薄膜.采用X射线衍射仪(XRD)、扫描电子显微镜(SEM)对CuGaSe2∶Ge薄膜的晶体结构和表面形貌进行了表征,采用紫外-可见分光光度计分析了CuGaSe2∶Ge薄膜的光吸收、反射和透射特性.结果表明,在CuGaSe2中掺Ⅳ族元素Ge,价带到中间带和中间带到导带的光子吸收能量分别为0.89 eV和0.71 eV,禁带宽度为1.60 eV,能够形成中间带.
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