为了从多晶试样的表面显示多晶试样的结晶学衬度,文中对两种电子光学光路进行了探讨。分析结果表明: 1.对标准扫描光路,电子通道显微像的放大倍数是由电子束的扫描角范围控制,而几何衬度和结晶学衬度的比例可通过讯号处理方法来调节; 2.对欠聚焦摇摆光路,电子通道显微像的放大倍数由失焦距离控制,而从变形试样所获得的异常位向衬度效应有可能通过重叠在电子通道显微像上的电子通道花样来注释。 文中用W,Mo和奥氏体不锈钢等试样进行了观察,本方法有可能用来研究多晶材料的位向分布和形变行为。
In order to reveal the crystallographic contrast from the surface of the polycrystalline specimen, two electron optical paths were analyzed. For the standard scanning path, the magnification of the channelling micrograph is controlled by the electron beam scanning angular field. The ratio between geometric and crystallographic contrast can be modulated by the signal processing method. For the defocused beam rocking path, the magnification is controlled by the defocused distance. The anomalous effects of the orientation contrast resulted by the deformed specimen may be interpreted by means of ECP superimposed on the channelling photograph.Observations were made of certain specimens such as W, Mo and 304 austenitic stainless steel. It seems that the present technique is available for study of both the orientation distribution and the deformation behaviour of the polycrystalline materials.
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