亚微米芯片通道中的沸腾相变极不稳定,在某些条件下,在芯片微通道的同一位置处会出现不同相态流体的交变现象,并伴随有剧烈的热力参数波动.本文通过显微观测和高速摄影技术,对芯片微通道沸腾相变过程中不同相态流体交变现象的成因及特点进行了揭示和分析,这对认识高热流密度条件下芯片微热沉中的流动非稳定性问题具有重要意义.
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