系统研究了（１－ｘ）Ｎａ１／２Ｂｉ１／２ＴｉＯ３－ｘＢａＴｉＯ３（ｘ＝０．０２、０．０４、０．０６、０．０８、０．１０）无铅压电陶瓷系统的相界、材料压电性能，弛豫特性及相变．这个系统的陶瓷材料具有Ｋｔ／Ｋｐ较大，频率常数比较高等特点．Ｘ－ｒａｙ衍射结构分析发现此系统的相界在０．０４＜ｘ＜０．０６之间；材料的一些主要性能在相界附近达到极值．利用介电系数－温度曲线，并结合热激电流曲线对此系统的弛豫性进行研究和分析；初步研究了各配方组成的铁电－顺电的相变过程，发现在一定的组成范围内，材料在由铁电相向顺电相的转变过程中经历了一个过渡相区．
For (1-x)Na1/2Bi1/2TiO3xBaTiO3(x=0.02, 0.04, 0.06, 0.08, 0.10) lead-free ceramic system the morphotropic boundary, piezoelectric property, relaxation
property and phase transition were investigated. The piezoelectric ceramics of this system possess large ratios of Kt/Kp and high frequency constants.
According to XRD patterns, the morphotropic boundary lies in the composition range of 0.04<x<0.06. The main physical properties of this system can reach
extreme values near the morphotropic boundary. The relaxation property of this system was studied by using dielectric constant-temperature curves and
thermally stimulated depolarization current (TSDC) curves. Phase transition from ferroelectric to paraelectric phase was also primarily discussed and
it was found out that the ceramics within a composition range possess transitional phase region between ferroelectric phase and paraelectric phase.
参考文献
| [1] | Takenaka T, Huzumi A, Hata T, et al. Silicates Industriels, 1993, 7-8: 136--142. [2] Takenaka T, Sakata K, Toda K. Ferroelectrics, 1990, 106: 375--380. [3] Takenaka T, Okuda T, Takegahara K. Ferroelectrics, 1997, 196: 175--178. [4] Nagata H, Takenaka T. Jpn. J. Appl. Phys., 1997, 36: 6055--6057. [5] Herabut A, Safari A. J. Am. Ceram. Soc., 1997, 80 (11): 2954--2958. [6] 王天宝, 高敏等(WANG Tian-Bao, et al). 无机材料学报(Journal of Inorganic Materials), 1987, 2 (3): 223--232. [7] Pronin I P, Syrnikov P P, Egorov V A, et al. Ferroelectrics, 1980, 25: 395--397. [8] Vakhrushev S B, Isupov V A, Kvyatkovsky B E, Ferroelectrics, 1985, 63: 153--160. [9] Suchanicz J, Poprawski R. Ferroelectrics, 1997, 192: 329--333. [10] Suchanicz J. Ferroelectrics, 1997, 200: 319--325. [11] Suchanicz J. Ferroelectrics, 1997, 190: 77--81. [12] 陈大任, 浦光华. 材料科学进展, 1992, 6: 326--330. [13] Setter N，Cross L E. J. Appl. Phys., 1980, 51: 4356--4360. |
- 下载量()
- 访问量()
- 您的评分：
-
10%
-
20%
-
30%
-
40%
-
50%