通常晶粒较大的样品无法采用常规X-ray衍射方法进行织构测试分析。针对粗晶薄带材样品，利用多片样品的侧面构造一个测试表面，从该组合面测得不完全极图并通过ODF计算和ODF转换计算的方法得到样品的晶粒取向信息，结果表明这种方法可以较好地解决粗晶薄带材样品的织构测试问题。
Generally the X-ray texture test was unsuitable for samples with coarse-grains. For the thin tape samples with coarse-grains on which the pole figure test cannot be taken using the normal method, the sample’s incomplete pole figures information were obtained on the resultant side faces of a number of tapes and then the sample’s texture information was gained by the way of the ODF transformation calculation. The result shows that the method is effective.
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