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用等离子体辅助MOCVD法在蓝宝石(α-A12O3)上生长了ZnO薄膜,测试了其退火和未退火薄膜的电阻率、电子浓度、迁移率、激光阈值,并通过X光衍射、光致发光方法表征了ZnO薄膜的质量,其结果是:退火薄膜的电子浓度低达1015/cm3量级、激光阈值降低近30倍、X光衍射峰半高宽是0.29°、在388nm附近的光致发光谱峰半高宽为0.32nm.这表明退火使ZnO薄膜的质量得到大幅度提高.

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