本文综述了与高分辨率定量电子显微学有关的电子显微镜和相关技术、电子显微术的发展现状及展望、材料结构和缺陷的原子尺度直接观察与计算机模拟综合对比研究以及电镜的三级像散、彗差和薄膜效应等因素影响定量高分辨电子显微学测量结果的研究现状.
This article summarizes the current and future trends of the development of electron microscope,related technique and high resolution quantitative electron microscopy The importance of the studies of structures and defects in materials by combining direct
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| [1] | |
| [2] | |
| [3] | |
| [4] | |
| [5] | |
| [6] | |
| [7] | |
| [8] | |
| [9] | |
| [10] |
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