用X射线光电子能谱(XPS)剥层分析方法,研究AIN薄膜在大气中加热时的氧化性能.结果表明,常温时AIN薄膜稳定;在700℃加热时,Al2O3膜开始增厚.AIN被氧化;加热温度愈高,AIN被氧化得愈剧烈.
The composition, phase structure and oxidized property of AIN films heated in atmosphere at different temperature have been investigated with X-ray photoelectron spectroscopy(XPS) in this paper.The results showed that about 60nm thick of Al2O3 film on the
参考文献
[1] | Perkin—ElmerCorporation,HandbookofX—rayPhotoelectronSpectroscopy,1978:102徐祖耀,金属材料热力学.北京:科学出版社,1983:2913吉林工业大学,物理化学.北京:机械工业出版社,1980:388—343 |
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