利用氧化膜应力原位测量装置对Ni20Cr微晶涂层/合金体系在1000 ℃空气中氧化过程中发生的弯曲挠度变化进行测量. 结果表明, 微晶涂层1000 ℃氧化所形成的Cr2O3氧化膜中存在压应力, 应力绝对值高于相同厚度的合金表面的热生长氧化膜, 其原因在于涂层/Cr2O3界面结合好, 应力释放较小. 降温冷却过程中, 通过微晶涂层的蠕变使部分氧化膜热应力得以释放.
The deflection data for the sputtered microcrystalline Ni20Cr coating/Ni20Cr alloy was measured during oxidation by using an apparatus for in-situ measurement of stresses in oxide scales. The results showed that the thermally grown oxide scale formed on the surface of microcrystalline coating was subjected to compressive stress. The growth stress of oxide scales on the Ni20Cr microcrystalline coating was higher than that on the corresponding alloy, which may be the reason responsible to the better interface adherence of the oxide scale/coating. During cooling, the microcrystalline coating was much plastic than the alloy, which might facilitate the partial release of the thermal stress of oxide scales.
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