采用Lange式透射X射线形貌照相法研究了电解充氢导致Fe-3wt-％Si单晶中氢损伤的规律。结果表明:在不加毒化剂的1mol/LH_2SO_4中电解充氢时,不产生氢损伤;在有毒化剂时,即使电流密度很低,也会产生氢损伤。在一定电流密度下产生的氢损伤有一极限大小,并不随充氢时间增加而无限止长大。随电流密度增加,氢损伤尺寸增大,但当电流密度较大时,这种增大不明显。外应力显著促进氢损伤。在含毒化剂时,氢渗透曲线随时间延长而下降是由于产生了氢损伤所致。
The formation and aggravation of hydrogen damage in Fe-3wt-%Si alloy during cathodic charging were studied by means of Lange transmission X-ray topography. Results showed that hydrogen damage did not form in the specimens charged in 0.5 mol/L H_2SO_4 solution without poison, and occurred with addtion of 250 mg / L As_2O_3 even at very low current density. As charging at a certain current density, the size of the damage may enlarge up to a limit yet no more by prolonged time. The damage size increases with increase of charging current density, but not so apparent at higher current density. An external tensile stress could promote obviously the formation of hydrogen damage. It seems that for charging in H_2SO_4 solution containing poison, the drop of hydrogen permeation curve against time prolongation is due to the formation of hydrogen damage.
参考文献
| [1] | |
| [2] | |
| [3] | |
| [4] | |
| [5] | |
| [6] | |
| [7] | |
| [8] | |
| [9] | |
| [10] | |
| [11] |
- 下载量()
- 访问量()
- 您的评分：
-
10%
-
20%
-
30%
-
40%
-
50%