采用射频磁控溅射法在玻璃衬底上制备了IGZO薄膜,研究了IGZO薄膜的性质和制备工艺条件.重点研究了射频功率对IGZO薄膜的结构特性、光电特性的影响以及厚度对薄膜电阻率的影响.制备的IGZO薄膜最高品质因子为1.94×10-3Ω-1,对应的薄膜电阻率和透过率分别为2.6×10-3Ω·cm和87.2％.
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