本文介绍了透射电镜综合分析—分散法测定纳米粒子粒径的方法,并将此法与X射线小角散射法及透射电镜暗场法测粒径进行了实验与分析的比较。认为采用X射线小角散射法与透射电镜综合分析—分散法相结合测定评估纳米粒子粒径可以以较快的速度得到准确的结果、综合的信息。
Method of TEM compositive anlysis-dispersion for measuring nano-particlesize is reviewed. Comparison of methods between this and of X-ray small angle scattering aswell as of TEM in dark field was carried out by experiments and anlyses. It is believed thatcombination of X-ray small angle scattering and TEM compositive analysis-dispersionmethod is the more rapid, accurate and comprehensive way to evaluate and measure thenano-particle size.
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