以不同晶面的Si片作为基底,室温下,采用射频磁控溅射的方法制备得到Ru非磁性薄膜.利用X射线衍射仪(XRD)、扫描电子显微镜(SEM)和原子力显微镜(AFM)分析薄膜的结构和形貌.研究不同基底材料对Ru中间层结构和形貌的影响.结果表明:以单晶Si(100)、Si(110)、Si(111)片作为基底制备的Ru薄膜均呈(002)晶面的择优取向生长；Ru-Si(100)、Ru-Si(110)和Ru-Si(111)薄膜表面均由细小的圆形晶粒组成.Si(111)面上生长的Ru薄膜表面颗粒尺寸最小,表面粗糙度最大,有利于磁记录层磁学性能的提高.
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