建立了不同偏心度C型环试样淬火和深冷处理过程的数值模型,探讨了偏心度对C型环试样淬火和深冷处理过程中组织和应力演变的影响.研究表明,在淬火过程中,偏心度越大,试样中残留奥氏体组织分布的不均匀性越明显.深冷处理后,试样中奥氏体分布的不均匀性得到显著改善,偏心度越小,改善效果越明显.深冷处理使试样中残留奥氏体含量减少了约14％.随着偏心度的减小,试样应力演变曲线上的应力峰值发生变化,影响应力峰值的主导因素由热应力转变为相变应力.相比淬火过程,深冷处理过程中的应力演变要平缓得多.无论是淬火还是深冷处理,试样的偏心度越小,其残余应力的分布越均匀.
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