利用同步辐射白光形貌术和透射电子显微镜,对BiB3O6晶体的缺陷进行研究.靠近籽晶部位,可以观察到包藏、位错和生长扇面边界,而远离籽晶的位置,没有发现任何微观的缺陷.通过实验观察,孪晶和生长扇面边界可能是导致晶体中褐色区域的形成原因.提出了消除缺陷的方法.
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