材料期刊网

The eutectic crystallization process of an amorphous Ni80P20 alloy was monitored by using electrical resistivity measurements (ERM). Upon heating the amorphous sample at constant rates. three distinct processes can be identified from the measured resistance variation with temperature during the crystallization including (i) crystal nucleation, (ii) subsequent growth of crystal nuclei, and (iii) coarsening of the crystallites. These features were verified by microscopy observations as well as the pre-annealing treatments. The activation energies for the crystal nucleation and growth determined from the ERM data agree satisfactorily with the literature data. The results indicated that the ERM is a very sensitive method in detecting detailed information during the early stage of crystallization from amorphous alloys.