采用磁控溅射的方法在SrRuO3/SrTiO3 (001)衬底上外延生长BiFeO3薄膜,研究以不同金属或氧化物做顶电极时的铁电、铁磁性质和漏电流及其导电机制.X射线衍射图谱和(φ)扫描图结果显示BiFeO3薄膜沿c轴外延生长,以Pt、Al做顶电极的薄膜剩余极化强度2Pr为68μC/cm2,生长Pt/SRO、FePt顶电极的薄膜剩余极化强度较小,2Pr为44μC/cm2,矫顽场2Ec约为370±20 kV/cm.薄膜的漏电流密度较小而且趋于饱和,在U=12 V时最大为1.94×10-3 A/cm2,体传导普尔弗兰克导电为BiFeO3薄膜主要的导电机制.BFO薄膜展现出弱磁性,饱和磁化强度为9.3 emu/cm3,矫顽场为338 Oe.
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