过渡金属氧化物NTC热敏材料具有良好的电阻-温度特性,是理想的温度传感材料.特别是薄膜材料,由于晶粒间的不完全接触和空洞的减少,可能从根本上解决目前广泛使用的体材热敏材料存在的稳定性和重复性差的问题.分析对比了几种常用的薄膜制备方法,认为溅射镀膜法更容易得到致密、平整的热敏薄膜;阐述了NTC热敏材料两种主要的电子传导模型:最近邻跳跃(NNH)模型ρ(T)=CT·exp(T0/T)和变程跳跃(VRH)模型ρ(T)=CT2p·exp(T0/T)p;介绍了当前薄膜热敏电阻的研究现状和存在的主要问题.
参考文献
| [1] | Electronic Materials Ⅱ[OL].http://www.Thermometrics.com,2004. |
| [2] | Schmidt R;Basu A;Brinkman A W .[J].Journal of the European Ceramic Society,2004,24(06):1233. |
| [3] | 王小军,李义兵,周继承.薄膜温度传感器敏感功能膜[J].材料导报,2005(04):67-70. |
| [4] | 徐开先.热敏电阻器[M].北京:机械工业出版社,1981:3. |
| [5] | 沈能珏;孙同年;余声明.现代电子材料技术[M].北京:国防工业出版社,2002:207. |
| [6] | 范家诚 .温度传感器及其应用[J].电子元件与材料,1995,14(05):45. |
| [7] | 周玉.陶瓷材料学[M].哈尔滨:哈尔滨工业大学出版社,1995:37. |
| [8] | Halcrow M A .Jahn-Teller distorder in crystalline transition metal compounds[OL].http://www.cds.dl.ac.uk/report/res_ high.html |
| [9] | Datta PK;Klusek Z;Basu A;Brinkman AW .Nanoscale studies of morphological and electrical properties of NixMn3-x,O3-delta (0.4 <= x <= 1) thin films by in-situ high temperature scanning tunneling microscopy and spectroscopy[J].Surface & Coatings Technology,2004(2/3):161-166. |
| [10] | Parlak M;Hashemi T;Hogan M J et al.[J].Thin Solid Films,1999,345(02):307. |
| [11] | 李正中.固体理论[M].北京:高等教育出版社,2002:363. |
| [12] | Shklovshii B I;Efros A L.Electronic properties of doped semiconductors[A].Berlin:Springer-Verlag,1984:45. |
| [13] | Schmit R;Basu A;Brinkman A W et al.[J].Applied Physics Letters,2005,86(07):1. |
| [14] | Schmit R et al.[J].Journal of the European Ceramic Society,2005,25(12):3027. |
| [15] | Park K .[J].Journal of the American Ceramic Society,2005,88(04):862. |
| [16] | Moonho Lee;Mina Yoo .[J].Sensors and Actuators A-physical,2002,96:97. |
| [17] | Moonho Lee.[A].,2001:4288. |
| [18] | Basu A;Brinkman A W;Hashemi T .[J].International Journal of Inorganic Materials,2001,3(08):1219. |
| [19] | Schmit R;Stiegelschmitt A Roose et al.[J].Journal of the European Ceramic Society,2003,23(10):1549. |
| [20] | Basu A;Brinkman A W;Schmit R et al.[J].Journal of the European Ceramic Society,2004,24(06):1149. |
| [21] | Schmit R;Basu A;Brinkman A W et al.[J].Surface Science,2005,595(03):239. |
| [22] | Basu A;Brinkman A W;Klusek Z et al.[J].Journal of Applied Physics,2002,92(07):4132. |
| [23] | Kanade S A;Puri Vijaya .[J].Materials Letters,2006,60(11):1428. |
| [24] | Kukuruznyak Dmitry A;Bulkley Scott A;Omland Kimberly A et al.[J].Thin Solid Films,2001,385(01):89. |
| [25] | Kukuruznyak Dmitry A et al.[J].Journal of Electron Spectroscopy and Related Phenomena,2006,150(03):275. |
| [26] | Kukuruznyak Dmitry A et al.[J].Journal of Electron Spectroscopy and Related Phenomena,2006,150(03):282. |
| [27] | [OL].http://www.lakeshore.com/temp/sen/smind dex.html |
| [28] | Muslim J;Baroch P;Vlcek J et al.[J].Thin Solid Films,2005,475(02):208. |
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