采用高温热裂解法制备出Si-B-C-N陶瓷样品,在1100℃和1400℃退火5h后XRD结果显示两个样品均保持非晶状态.采用电流-电压直流测试方法,确定了样品在室温至1100℃温度范围内的直流电导率,材料的电导率在整个温度范围内均随着温度的升高而增大,呈现出非晶半导体的特性.退火温度升高导致电导率显著增大,这与高温退火过程中H的失去有关.
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