为研究HgI2晶体结构缺陷与光吸收的关系,测试了晶体的UV和中红外透过光谱.结果表明,波长约为580 nm时,存在着本征吸收限;波长大于580 nm时,随波长增加,晶体对光的吸收减小,透过率达到45%以上;在1000~2500 nm范围内,UV光谱存在四个明显的光吸收带,对应的入射光能量分别为0.79±0.01 eV,0.72 eV,0.57±0.01 eV 和0.53 eV.中红外透过曲线随波长增加而增大,透过率为39%~68%.通过M/HgI2的I~t曲线,采用简单能级模型进一步确认了生长的HgI2晶体存在0.79±0.01 eV和0.72 eV两个陷阱能级.分析认为,HgI2晶体层间的相对移动形成的结构缺陷造成1572.5 nm(0.79±0.01 eV)和1729.2 nm(0.72 eV)处的吸收,晶体缺碘造成2117.5 nm(0.57±0.01 eV)处的吸收和汞空位造成2305.8 nm(0.53 eV)的吸收.在中红外波段,晶体结构缺陷造成了显著的晶格吸收.严格控制原料的化学计量比有利于减少HgI2晶体的结构缺陷,提高晶体的光学性能.
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