Variation of nonlinear optical properties with surface roughness of ZnO thin films deposited on corning glass substrates at different annealing temperature (TA) was reported. The films were characterized by X-ray diffraction (XRD), UV-Vis-NIR transmission and single beam z-scan technique using second harmonics of Nd:YAG laser. Surface morphology of the samples was investigated by atomic force microscopy (AFM). Surface roughness was found minimum (8.4 nm) for ZnO sample annealed at 450 °C. The nonlinear optical properties (NLO) were found to be dependent on surface roughness and the highest value of third order nonlinear susceptibility (χ3)=4.3×10-7 esu) was obtained for ZnO at TA 450 °C.
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