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利用非平衡磁控溅射离子镀技术于不同磁控管非平衡度和磁场闭合状态下在单晶硅基体上制备出Cr镀层,采用扫描电子显微镜、X射线衍射仪分析了不同生长阶段Cr镀层的微观形貌、表面粗糙度和晶体择优牛长趋势的变化.结果表明:磁控管非平衡和磁场闭合状态的改变显著影响着Cr镀层生长过程中的结晶取向、表面粗糙度和致密度.不同非平衡度下,Cr镀层组织为疏松的柱状晶体组织,镀层表面粗糙度随磁控管非衡度的增大而增大.随着磁场闭合程度的增加,Cr镀层组织由疏松的柱状晶体组织,向较致密的柱状晶体再向致密的无明显柱状晶体的组织转化,镀层晶体有沿低能量(110)晶面生长向高能量(200)晶面过渡择优生长的趋势.

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