硅胶作为色谱分离科学中最常使用的柱填料,其孔结构对色谱的分离性能起决定作用,所以研究填料的孔结构具有重要意义.本文通过对硅胶填料进行包埋切片,然后用扫描电镜观察其孔结构,并将此法与BET法、压汞法等传统方法测得的结果进行了比较,结果表明:此法是这些检测手段的必要补充,并且能为色谱工作者研究填料的孔结构提供更加准确、形象、直观的结构信息.
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