Growth Defects in Langasite Crystals Observed with White Beam Synchrotron Radiation Topography

稀土学报(英文版), 2006, 24(z1): 159-161.

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1.State Key Laboratory of Crystal Materials, Shandong University, Jinan 250100, China

2.State Key Laboratory of Crystal Materials, Shandong University, Jinan 250100, China

3.State Key Laboratory of Crystal Materials, Shandong University, Jinan 250100, China

4.State Key Laboratory of Crystal Materials, Shandong University, Jinan 250100, China

5.State Key Laboratory of Crystal Materials, Shandong University, Jinan 250100, China

6.Beijing Synchrotron Radiation Laboratory, Institute of High Energy Physics, Beijing 100039, China

7.Beijing Synchrotron Radiation Laboratory, Institute of High Energy Physics, Beijing 100039, China

Growth Defects in Langasite Crystals Observed with White Beam Synchrotron Radiation Topography

Keywords： Langasite (LGS crystal)

Langasite single crystal was grown by the Czochralski method and its perfection was assessed by white beam synchrotron radiation topography. It is found that the growth core and the growth striations are the primary growth defects and they show strong X-ray kinematical contrast in the topographs. Another typical defect in LGS crystal is dislocation. The formation mechanisms of these growth defects in LGS crystals were discussed.

参考文献

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[2]	Kong Haikuan;Wang Jiyang;Zhang Huaijin.Growth,properties and application as an electrooptic Q-switch of langasite crystal[J].Journal of Crystal Growth,2003:14.
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Growth Defects in Langasite Crystals Observed with White Beam Synchrotron Radiation Topography

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