利用飞秒时间分辨磁光Kerr光谱技术结合振动样品磁强计(VSM),分别研究了以SiO2为基底无保护层的TbFeCo薄膜以及以SiN为保护层的TbFeCo薄膜的磁光性质.对于无保护层的TbFeCo样品,VSM测量结果发现磁滞回线形状倾斜,且包含面内磁矩;Kerr回线测量结果发现探测脉冲通过表面层所测得的回线形状倾斜而通过基底层所测得的回线形状方正,揭示样品表面发生氧化形成了表面氧化层,而底层由于SiO2基底层的保护作用保持样品原有的磁光性质.对于以SiN为保护层的TbFeCo样品,VSM和Kerr回线的测量结果发现回线形状保持方正,揭示SiN保护层可以防止样品发生氧化而使其保持原有的磁光性质.研究结果对于TbFeCo磁光薄膜的热稳定性保护具有重要意义.
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