采用有限元法计算了300 mm硅单晶生长过程中,热屏结构对炉体内温度分布、熔体中流场以及晶体内热应力的影响.计算所用的模型涵盖了晶体生长过程中的主要物理现象,包括结晶潜热的释放、结晶前沿的形变、熔体中热和质的传输以及氧的输运等.计算结果表明使用直壁式热屏时,晶体-熔体界面变得更加平坦同时结晶前沿处的热应力大幅度下降,减少了发生宏观位错的可能性,此外熔体中的氧含量显著降低.
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