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利用拉曼光谱结合X射线衍射分析对未掺杂和掺杂的ZnO薄膜、陶瓷薄膜进行了研究.ZnO薄膜及ZnO陶瓷薄膜均由sol-gel法制备,掺杂组份有Bi2O3、Sb2O3、MnO和Cr2O3等.结果表明,未掺杂的薄膜的ZnO主晶相均表现出显著的定向生长特征,其拉曼光谱特征谱峰为437cm-1,谱峰强度随薄膜退火温度的提高略有增强.掺杂后ZnO的拉曼谱峰发生了红移.掺Bi2O3后ZnO的拉曼谱峰由347cm-1移质移至434cm-1,掺Sb2O3后ZnO的拉曼谱峰移至435cm-1,而掺杂Bi2Os、Sb2O3、MnO和Cr2O3等组份的ZnO陶瓷薄膜的ZnO拉曼谱峰则移至434cm-1,说明掺杂元素进入了ZnO晶格,引起了晶格的变化.ZnO薄膜性能不仅受次晶相组成的影响,而且受因掺杂元素进入而引起的ZnO晶格畸变的影响.

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