介绍了采用混合物理化学气相法(HPCVD)工艺以乙硼烷(B2H6)为硼源在热蒸发镀膜机内以不同的沉积温度在(0001)取向的Al2O3单晶基底上制备了MgB2超导薄膜,采用扫描电子显微镜(SEM)、X射线衍射(XRD)和标准四线法电阻测量分析了沉积温度对生成的MgB2薄膜的表面形貌、晶体结构、超导转变温度的影响.结果表明,随着基底温度的升高,MgB2相结晶程度提高,c轴取向程度增强,薄膜整体性能显著提高.
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