采用传统的轧制和退火工艺制备了0.30mm厚的6.5%（质量分数）Si高硅电工钢薄板,采用X射线衍射技术对退火过程中的再结晶织构进行了研究。冷轧高硅钢薄板700℃退火形成以{111}〈112〉为峰值的γ织构（〈111〉∥ND）和以{001}〈210〉为峰值的{001}织构;而900℃以上温度退火则形成强{001}〈210〉织构。进一步的研究表明是在晶粒长大过程中{001}〈210〉发展成为主要再结晶织构组分。
High silicon steel thin sheets with thickness of 0.3mm were successfully produced by conventional rolling and annealing methods.Recrystallization texture was investigated by means of X-ray diffraction.It is found that recrystallization texture is mainly composed of γ fiber（〈111〉∥ND）with peak at {111}〈112〉 and {001} fiber with peak at {001}〈210〉 after annealing at 700℃,while strong {001}〈210〉 component dominates recrystallization texture after annealing above 900℃.It is during grain growth that {001}〈210〉 is significantly enhanced and finally develops to the main texture component.
参考文献
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