基于原有的水电极老化方法，提出了一种能有效加速XLPE电缆绝缘中水树生长的新型水电极法，并针对该方法的老化机制进行了讨论。采用改进后的新型水电极法老化XLPE电缆制作水树样本，测量老化过程中电缆样本的介质损耗正切角（tanδ）的变化。利用光学显微镜、红外光谱（IR）和扫描电镜（SEM）分析电缆样本中水树的微观结构和形貌变化，提出相应的微观老化模型。结果表明：采用改进后的水电极法生成的水树尺寸和微观形貌差异较小，水树长度在300~400μm之间，水树形貌为团状，水树缺陷内部微孔或通道的直径在几微米到几十微米之间。采用新型水电极法老化的电缆试样稳定有效，可生成符合典型结构和特征的水树，为进一步研究电缆绝缘老化机理提供了可靠的保证。
A new water electrode method, which can accelerate the growth of water tree in XLPE cable insulation, was presented based on the old water electrode method, and its ageing mechanism was dis-cussed. Aged XLPE cable samples were prepared by the new water electrode method, and their dielectric loss tangle (tanδ) during the ageing process was tested. The micro-structure and morphology change of water tree in the cable samples were analyzed by optical microscope, infrared spectrum (IR), and scan-ning electron microscope (SEM), and a micro ageing model was presented. The results show that the size and micro-structure of the water trees generated by the improved water electrode method are almost the same. The size of water tree is between 300 μm and 400 μm, and the water tree is clump-shaped. The diameter of the micropore or channel in water tree defects ranges from a few micrometers to doz-ens of micrometers. The new water electrode method is more effective and stable to generate the water tree with typical structure and characteristic in the cable samples, which provides reliable guarantee to study the ageing mechanism of cable insulation.
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