薄膜硅/晶体硅异质结(HIT)太阳电池是界面器件,其界面性质直接决定器件的性能.本文采用简化的RCA清洗并结合氧化膜保护工艺对硅片进行前期处理;采用等离子体增强化学气相沉积技术(PECVD)制备薄膜硅/晶体硅异质结;通过光发射谱(OES)研究了PECVD在不同的匹配速度下起辉基元浓度随时间的变化,证实了基元浓度的不稳定对电池界面性质有一定的影响;分析了退火工艺对异质结的界面特性的影响,在10-4 Pa量级的背景真空和200℃下进行退火,可显著提高电池开路电压Voc和填充因子FF.本文结果表明:硅片前期处理的氧化膜保护工艺及后退火处理,皆可明显地改善HIT电池的界面性质、提高电池的转换效率.
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