测量了非晶态NiCrFeSiB合金电化学渗氢前后的正电子寿命谱,探索氢与非晶态结构中的空位型缺陷的相互作用.合金中主要存在自由体积和空位团两种类型的缺陷,低电流渗氢对缺陷结构无明显影响,高电流渗氢导致空位团型缺陷浓度升高,但不稳定,当氢逸出后又会分解,合金结构恢复到稳定状态.
The positron lifetime in amorphous NiCrFeSiB alloy with and without hydrogen charging was measured to understand the interaction between hydrogen and point defects in amorphous structure. Free volume and vacancy group were found in the alloy as main defec
参考文献
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