为研究激光喷射钎料球键合焊点的可靠性,用Sn3.0Ag0.5Cu钎料球对Au/Cu焊盘进行了激光喷射钎料键合试验,采用微强度测试仪、扫描电子显微镜、能谱分析仪研究了热循环条件对接头强度以及界面微观组织演变的影响.结果表明:采用激光喷射钎料键合技术焊盘表面Au层不能完全溶入钎料中,导致在界面处形成AuSn2+AuSn4多层金属间化合物结构;热循环处理可导致界面残余的Au层消失,并在原位附近形成以Au、Sn为主并固溶少Cu原子的反应层,引起整个反应层与Cu层的结合力下降.
To investigate the reliability of solder joint by laser jet solder ball bonding method,Au/Cu soldering pads were bonded with Sn3.0Ag0.5Cu solder ball.The joint strength was tested by micro-strength tester,the interfacial microstructures were analyzed using SEM and EDX,and the influences of thermal shock treatment on the evolution of interfacial microstructure and joint strength were investigated as well.Results show that the Au finish cannot completely dissolve into solder during the process of solder jet ball bonding,which leads to the formation of multilayer structure of AuSn2+AuSn4.After thermal shock treatment,the residual Au layer vanishes and(Au,Sn,Cu) reactive layer forms,which leads to the reduction of joint strength.
参考文献
[1] | Liang Yin;Stephan J. Meschter;Timothy J. Single .Wetting in the Au-Sn System[J].Acta materialia,2004(10):2873-2888. |
[2] | Keun-Soo Kim;Motoharu Haga;Katsuaki Suganuma .In-Situ Observation and Simulation of the Solidification Process in Soldering a Small Outline Package with the Sn-Ag-Cu Lead-Free Alloy[J].Journal of Electronic Materials,2003(12):1483-1489. |
[3] | Ho C.E.;Tsai S.Y.;Kao C.R. .Reaction of solder with Ni/Au metallization for electronic packagesduring reflow soldering[J].IEEE transactions on advanced packaging,2001(4):493-498. |
[4] | C. E. Ho;S. C. Yang;C. R. Kao .Interfacial reaction issues for lead-free electronic solders[J].Journal of Materials Science. Materials in Electronics,2007(1/3):155-174. |
[5] | 蒋传文,杨圣文,池勇.硬盘磁头激光锡球焊接有限元分析[J].现代制造工程,2005(06):46-48. |
[6] | 刘小康,杨圣文,蒋传文.硬盘磁头焊点优化及可靠性分析[J].焊接学报,2006(08):83-87. |
[7] | 刘永岳 .喷射钎料球键合接头成型特征研究[D].哈尔滨工业大学,2007. |
[8] | Yin, L;Chauhan, A;Singler, TJ .Reactive wetting in metal/metal systems: Dissolutive versus compound-forming systems[J].Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing,2008(1/2):80-89. |
[9] | A. Paul .Comments on "Room temperature interfacial reactions in electrodeposited Au/Sn couples"[J].Scripta materialia,2009(6):561-563. |
[10] | 陈松,刘泽光,陈登权,罗锡明,许昆,邓德国.Au/Sn界面互扩散特征[J].稀有金属,2005(04):413-417. |
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