利用KKSO多相场模型,研究CBr4-C2Cl6过共晶合金,当层片间距为4.1 μm时,层片厚度对三维共晶层片生长过程的影响.研究表明层片厚度对三维共晶层片生长影响显著,厚度效应有可能导致层片取向的垂直偏转和倾斜偏转.层片厚度比较小时,共晶层片以类似于二维的1 λ振荡形式生长;当层片厚度大于6.4 μm以后,层片开始偏转,并最终在横截面上垂直于初始层片方向;层片厚度在8.6～14.2 μm之间取值时,在横截面内层片发生倾斜;之后,出现Z字形分叉,进一步增加层片厚度值至18.2 μm时,共晶层片又发生垂直偏转.
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