欢迎登录材料期刊网

材料期刊网

高级检索

采用MOCVD技术在蓝宝石衬底(0001)面上生长了GaN外延膜,利用原子力显微镜AFM、扫描电镜SEM分析了薄膜表面形貌,利用纳米压痕仪和UMT试验机考察了GaN膜的硬度、临界载荷以及摩擦学性能等.结果表明,薄膜以二维模式均匀生长,表面平整,硬度达22.1 MPa,弹性模量为299.5 GPa,与衬底结合紧密,临界载荷达1.6N,与GCr15钢球对磨时摩擦系数仅为0.13,与Si3N4陶瓷球摩擦时膜很快就磨穿.

参考文献

[1] Nakamura S;Senoh M;Iwasa Nower et al.[J].Applied Physics Letters,1995,67(13):1868.
[2] Nakamura S;Senoh M;Nagahama S;Iwasa N;Yamada T;Matsushita T;Sugimoto Y;Kiyoku H .Room-temperature continuous-wave operation of InGaN multi-quantum-well structure laser diodes with a lifetime of 27 hours[J].Applied physics letters,1997(11):1417-1419.
[3] Lim B W;Chen Q C;Yang J Y et al.[J].Applied Physics Letters,1996,68(26):3761.
[4] 李镇江,李贺军,陈小龙,李克智,曹永革,李建业.低维GaN纳米材料的最新研究进展[J].稀有金属材料与工程,2002(05):321-324.
[5] Etzkom E V;Clarke D R .[J].Journal of Applied Physics,2001,89(02):1025.
[6] Krost A;Dadgar A;Strassburger G et al.[J].Physica Status Solidi,2003,200(01):26.
[7] Motoki K;Okahisa T;Matsumoto N et al.[J].Japanese Journal of Applied Physics,2001,40:L140.
[8] Danielsson E;Zetterling C;Ostling M et al.[J].IEEE Transactions on Electron Devices,2001,48(03):444.
[9] Drory M D;Ager J W;Suske T et al.[J].Applied Physics Letters,1996,69(26):4044.
[10] Yu G.;Egawa T.;Soga T.;Watanabe J.;Jimbo T.;Umeno M.;Ishikawa H. .Mechanical properties of the GaN thin films deposited on sapphire substrate[J].Journal of Crystal Growth,1998(0):701-705.
[11] Oliver W C;Pharr G M .[J].Journal of Materials Research,1992,7(06):1564.
[12] Kucheyev S O;Bradby J E;Williams J S et al.[J].Applied Physics Letters,2000,77(21):3373.
上一张 下一张
上一张 下一张
计量
  • 下载量()
  • 访问量()
文章评分
  • 您的评分:
  • 1
    0%
  • 2
    0%
  • 3
    0%
  • 4
    0%
  • 5
    0%