采用直流磁控溅射法在SrTiO3(100)衬底上制备a轴取向的YBa2Cu3O7-x薄膜,用四引线法测量R-T曲线Tc0=86K.对于YBa2Cu3O7-x薄膜进行喇曼光谱测量,发现0(4)振动的声子峰(～500cm-1)强度远远大于0(2)-0(3)反相振动的声子峰(～340cm-1)强度,应用群论分析证明薄膜主要是沿a轴生长的.在较低的衬底温度下(<780℃),YBa2Cu3O7-x薄膜沿a轴生长,随着衬底温度的升高,薄膜中沿c轴生长的组分逐渐增加.
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