以正硅酸乙酯为前驱体,采用模板法制备了粒径为50 nm左右的SiO<,2>空心球,并将其掺入到环氧树脂中,制备了EP/SiO<,2>空心球纳米复合材料.采用傅立叶变换红外光谱(FT-IR)、扫描电子显微镜(SEM)、热重分析(TGA)和精密阻抗分析仪分别对复合材料的化学结构、断面形貌、热稳定性及介电性能进行了表征.结果表明:在掺杂量不大于10%范围内,EP/SiO<,2>空心球纳米复合材料的介电常数随电场频率的升高而逐渐降低,相同测试频率下,复合材料的介电常数随纳米SiO<,2>含量的增加而降低;复合材料的介质损耗(tanδ)随着频率的增加而增加,在10<'2>~10<'4>Hz,复合材料的tanδ均大于纯EP;在10<'4>~10<'6>Hz,复合材料的tanδ均小于纯EP;复合材料的热稳定性稍有改善.
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