用X射线光电子能谱(XPS)研究了3.0 keV Ar离子轰击高定向裂解石墨(HOPG)引起的表面结构的变化.通过对C1s、C KLL及C2s谱峰形状的定性和定量分析,表明Ar离子轰击将破坏共价π键并导致表面局域sp2杂化C键向sp3杂化C键转化.sp3/sp2之比依赖于离子轰击时间.
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